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NIKON N-SIM & TIRF Structured Illumination Microscope

Technical description  

Microscope Stand: Ni-E Eclipse  

Available Objectives:

Magnification Medium Numerical Aperture Working Distance (mm) Correction Collar
10x Air 0.50 4.0 N
40x Air 0.60 3.6 Y
60x Water 1.27 0.18 Y
100x (TIRF) Oil 1.49 0.12 Y

Laser Lines solid state lasers for: 405 nm, 488 nm, 561 nm, 640 nm 

Filters: DAPI, FITC, TRIC, Cy5

Detectors: Andor iXon Ultra EMCCD